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Material

Test Sockets & Pogo Pins

Sockets that connect the device to the test board in final test and burn-in, together with the pogo pins and hardware that carry the repeated contact.

What We Supply

Specifications depend on the package type and process conditions. These are the categories we supply.

Test Socket

Connects the device to the test board during final test. Built for the package type and pin pitch, with handler compatibility considered alongside.

Packages
BGA, QFN, QFP, SOP, LGA and others
Key factors
Contact resistance, insertion life, handler fit

Burn-in Socket

Used in burn-in, where the socket sits at high temperature for long periods. Heat-resistant materials and a structure that survives repeated insertion are what matter.

Environment
Sustained high temperature
Key factors
Heat resistance, insertion durability

RF Socket

For RF devices where high-frequency behaviour must be preserved. The design keeps the signal path short and manages impedance matching and loss.

Key factors
Impedance matching, insertion loss, signal path length

Memory Socket

For DRAM, NAND and similar memory devices. High pin counts and high test volumes make durability and serviceability especially important.

Devices
DRAM, NAND and similar
Key factors
High-pin alignment, durability, maintenance

Pogo Pin

Spring-loaded contact pins for sockets and test fixtures where contact is made repeatedly. Stroke, contact force and plating determine life and contact stability.

Main specs
Pitch, stroke, contact force, plating
Used in
Sockets, test fixtures

Stiffener & Change Kit

Stiffeners that fix the socket to the board, and change kits for device changeover. A socket on its own is often not enough to put a line into production.

Includes
Stiffener, change kit, lid solution

Useful to Confirm Before Enquiring

  • Device package type and dimensions (BGA, QFN, QFP, LGA and so on)
  • Pin count and pin pitch
  • Process — final test, burn-in or system-level test
  • Operating temperature range
  • Target insertion count (expected socket life)
  • Test handler and board specification in use
  • Quantity and required delivery date

Where It Is Used

  • Final test lines in semiconductor back-end
  • Burn-in and reliability evaluation
  • RF and communication device testing
  • Memory (DRAM, NAND) testing
  • MCU and analog IC testing
  • Prototype evaluation during development

The above describes the categories and the usual selection criteria. Individual socket specifications follow from the device and the process, so send us the package information and we will propose a suitable specification.

Request a Quote

Tell us the specification and quantity and we will come back to you directly. Drawings or package information help us answer faster.

Email Us

jason@ion-chip.com